M.S Thesis : Shape measurement of specularly reflective surfaces by the observation of reflected fringes
E-mail : hansini@postech.ac.kr
Jun Lim
Graduated with Ph.D in 2011.2 Present affiliation : Pohang Accelerator Laboratory
Ph.D Thesis : High resolution soft X-ray digital in-line holographic microscopy
E-mail : limjun@postech.ac.kr
Yun-Seong Jeon
Graduated with Ph.D in 2010.2
Present affiliation : Samsung Electro-Mechanics
Ph.D Thesis : Application of digital holography to numerical image adjustments in optical tomography
and section imaging
E-mail : artemis@postech.ac.kr
Yong-Ku Lee
Graduated with M.S in 2010.2
Present affiliation :
M.S Thesis : Application of the phase-summation procedure for ehhancement of the sensitivity
in surface shape measurement
E-mail : nugul7@postech.ac.kr
Soo-Hee Oh
Graduated with M.S in 2009.8
Present affiliation : Samsung Electronics
M.S Thesis : Section image measurement of low reflectance surfaces using illumination-angle-scanning method
E-mail : pello@postech.ac.kr
Chong-Kun Lee
Graduated with M.S in 2009.2
Present affiliation : LG Chem
M.S Thesis : Surface shape measurement by phase-shift interferometry with a tilt of illumination beam
E-mail : chongkun@lgchem.com
Seung-Jun Chung
Graduated with Ph.D in 2008.8
Present affiliation : Samsung Electronics
Ph.D Thesis : Reconstruction of digital holograms and its application to tomographic imaging
E-mail : feeling@postech.ac.kr
Graduated with M.S in 2008.2
Present affiliation : Samsung Electronics
M.S Thesis : A study on Application of low coherence phase-shifting digital holography
E-mail : tonky@postech.ac.kr
Jeon-Woong Kang
Graduated with Ph.D in 2007.8
Present affiliation : MIT Post.Doc
Ph.D Thesis : Phase shifting digital holography and its applications to quantitative phase contrast microscopy
E-mail : jwkang76@gmail.com
Young-Ran Son
Graduated with M.S in 2007.2
Present affiliation : Samsung Electronics
M.S Thesis : Phase-shifting digital holography with a low-coherence source
E-mail : yran.son@samsung.com
Sun-Joo Park
Graduated with M.S in 2006.8
Present affiliation :
M.S Thesis : Development of a Full-field optical coherence tomography system and Iterative Deconvolution
Algorithms
E-mail : detour1@postech.ac.kr
![]() Graduated with Ph.D in 2005.8
Present affiliation : Samsung Electronics
Ph.D Thesis : Development of Thickness Probing Method of Overlayer Using Total Electron Yield Mode Image and
Construction of 50nm Resolution Transmission X-Ray Microscopy
E-mail : geunbae@postech.ac.kr
Graduated with M.S in 2005.2
Present affiliation :
M.S Thesis : Vibration and offset phase analysis using electronic speckle pattern interferometry and
stroboscopic method
E-mail : jwkang76@gmail.com
Graduated with Ph.D in 2004.2
Present affiliation : Samsung Electronics
Ph.D Thesis : A Study on The Phase-Shift Analysis by Intensity Correlation Modeling and Its Application
to Digital Holography
E-mail : behappy@postech.edu
Jeong-Yeon Seo
Graduated with M.S in 2002.2
Present affiliation :
M.S Thesis : Displacement measurement using image correlation
E-mail : alibis@anyon.postech.ac.kr
Sung-Jin Park
Graduated with M.S in 2000.2
Present affiliation : Samsung Electronics
M.S Thesis : Automated Shape Measurement Using an Optimized Phase Stepping Algorithm
E-mail : tortoiss@samsung.co.kr
Ho-Young Yang
Graduated with M.S in 1999.8
Present affiliation :
M.S Thesis : A Study of non-destructive evaluation using phase-shifting ESPI
E-mail : yangong@anyon.postech.ac.kr
Graduated with Ph.D in 1999.2
Present affiliation :
Ph.D Thesis : Studies on the Two-Photon Quantum Interferometry
E-mail : tgnoh@saitgw.sait.samsung.co.kr
Graduated with Ph.D in 1998.2
Present affiliation : Samsung Electronics
Ph.D Thesis : Precise Phase Measurement in Phase-Shifting Interferometry and Its Applications
E-mail : hsryu@saitgw.sait.samsung.co.kr
Graduated with M.S in 1998.2
Present affiliation :
M.S Thesis : A study of the phase shifting profilometry andthe comparison of two profiles
E-mail : mornstar@anyon.postech.ac.kr
Myoung-Hoon Jo Graduated with M.S in 1998.2
Present affiliation :
M.S Thesis : A Study on the 3-Primary Color Phase Shifting Profilometry Based on Color TransformationMatrices
E-mail : jmhoon@anyon.postech.ac.kr
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